Timing Generator

A timing generator adapted to receive test pattern data to be supplied to a device under test and rate data for setting the period of the test pattern data, and control the timing of outputting the test pattern data to the device under test according to the rate data, comprising:

• a delay setting data generator operative to receive the rate data and generate delay setting data;
• and
• a variable delay circuit operative to delay the test pattern data by a delay time determined by the delay setting data with reference to a predefined unit amount of delay,
• wherein
• the rate data comprises first rate data designating the period of the test pattern data with a precision determined by the unit amount of delay and second rate data designating the period of the test pattern data with a precision higher than that determined by the unit amount of delay, and
• the delay setting data generator is operative to output a first value and a second value in a time division manner at a ratio determined by the second rate data, the first value being determined by the first rate data and the second value being determined by the first rate data and different from the first value.