US 2010/0164529 A1 · SEMICONDUCTOR DEVICE TEST SYSTEM

Abstract

A test system for semiconductor devices including a tester, a test station, a first controller, and one or more second controllers, is disclosed. The tester handles operations of the test system. The test station, coupled to the tester, receives test information from the tester via a transmission path, where the test station performs a test process to a semiconductor device under test according to the test information, and then provides a test result to the tester. The first controller, electronically connected to the test station, receives the test information. The second controllers, electronically connected to the test station, handles the test process of the test station, where each the second controller corresponds to one or more semiconductor device under test. The first controller broadcasts the test information to one or more second controllers and receives the test result from the second controllers through an infrared communication interface.

Claims27

Dependent claims

A test system for semiconductor devices, comprising:

a tester for handling operations of said test system;
a test station coupled to said tester for receiving test information from said tester via a transmission path, wherein said test station performs a test process to a semiconductor device under test according to said test information, and then provides a test result to said tester;
a first controller electronically connected to said test station for receiving said test information;
and
one or more second controllers electronically connected to said test station for handling said test process of said test station, wherein each said second controller corresponds to one or more said semiconductor device under test,
wherein said first controller broadcasts said test information to one or more second controllers and receives said test result from said second controllers through an infrared communication interface.

3 more elements

A test system for semiconductor devices, comprising:

a tester for handling operations of said test system;
and
a test station coupled to said tester for receiving test information from said tester through an infrared communication interface to perform a test process to a semiconductor device under test according to said test information, and then provides a test result to said tester, wherein said tester includes:
(a) a third control unit for handling operations of said tester;
(b) a third infrared transmission unit coupled to said third control unit for transmitting said test information to said test station or receiving said test result from said test station through said infrared communication interface;
(c) a wireless communication unit coupled to said third control unit for providing a communication interface between said tester and an external base station;
(d) a third memory unit coupled to said third control unit for storing data or software required by said third control unit;
(e) an input unit coupled to said third control unit for providing an input interface for said tester;
(f) an alarm unit coupled to said third control unit for sending a notification message at a predetermined state;
and
(g) a display unit coupled to said third control unit for showing said test result.

8 more elements

Dependencies are inferred from the claim text.

Semiconductor device test system

Life of this patent

Semiconductor device test system

Life of this patent

Abstract

Claims27