Plasma cvd apparatus, method for forming thin film and semiconductor device
AssigneeMitsubishi Electric Corporation
InventorsTeruhiko Kumada, Hideharu Nobutoki, Naoki Yasuda
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AssigneeMitsubishi Electric Corporation
InventorsTeruhiko Kumada, Hideharu Nobutoki, Naoki Yasuda
Estimating the term…
A plasma CVD apparatus including a reaction chamber including an inlet for supplying a compound including a borazine skeleton, a feeding electrode, arranged within the reaction chamber, for supporting a substrate and being applied with a negative charge, and a plasma generating mechanism, arranged opposite to the feeding electrode via the substrate, for generating a plasma within the reaction chamber. A method forms a thin film wherein a thin film is formed by using a compound including a borazine skeleton as a raw material, and a semiconductor device includes a thin film formed by such a method as an insulating film. The apparatus and method enable to produce a thin film wherein low dielectric constant and high mechanical strength are stably maintained for a long time and insulating characteristics are secured.
1-9. (canceled)
A thin-film forming method comprising:
A plasma CVD apparatus supplied with a compound including a borazine skeleton and activating a film on a substrate by plasma induction to successively bond the bolazine skeleton of said compound in reaction active state to said activated film on said substrate and polymerize the borazine skeleton to deposit a polymerized film including the borazine skeleton on said substrate, thereby forming the polymerized film including the borazine skeleton on said substrate, comprising:
Dependencies are inferred from the claim text.