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US 2010/0163756 A1Published application
Single event upset (SEU) testing system and method
AssigneeCustom Test Systems, LLC.
InventorRichard McPeak
Life of this patent
Estimating the term…
Abstract
One embodiment of the invention relates to a circuit board for testing upsets caused by charged particles delivered under testing conditions. The circuit board comprises a device under test including an internal memory, a memory control unit to generate test patterns for comparison with data read from stored areas within the internal memory of the device under test, and a memory that is configured to only store error data. Other embodiments are described and claimed.
Claims17
A circuit board comprising:
- a device under test including an internal memory;
- a memory control unit to generate test patterns for comparison with data read from stored areas within the internal memory of the device under test;
- and
- a memory that is configured to only store error data.
1 more element
A system comprising:
- a particle emission device to emit a stream of charged particles;
- and
- a circuit board including a device under test situated within a path of the stream of charged particles, the device under test including an internal memory having areas that store data, (ii) a memory control unit to generate a test pattern for comparison with the data read from the areas of the internal memory, and a memory that is configured to only store error data computed from the comparison of the data and the test pattern.
A computer comprising:
- a display monitor;
- and
- a processor to (i) receive error data from a circuit board adapted with an integrated circuit with internal memory that is situated to receive a controlled stream of charged particles, and (ii) generate a representation of storage areas within the internal memory for display on the display monitor, the representation indicating what portions of the storage areas of the internal memory have experienced errors caused by the controlled stream of charged particles.
Dependencies are inferred from the claim text.