Radiation detection apparatus
AssigneeOsaka Electro-Communication University
InventorHideharu Matsuura
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AssigneeOsaka Electro-Communication University
InventorHideharu Matsuura
Estimating the term…
A semiconductor substrate is composed of a SiC crystal. A metal film having a desired area and serving as an incident surface onto which X-rays are made incident is formed on one surface of the semiconductor substrate. An electrode having the shape of a circle is formed at the central portion of the other surface of the semiconductor substrate. A ring-shaped electrode is formed in a portion near the circumference of the semiconductor substrate so as to surround the electrode. A predetermined direct voltage is applied to the metal film and the ring-shaped electrode. A voltage of a ground level is applied to the electrode. X-rays (γ-rays) that are made incident onto the metal film cause the generation of electron-hole pairs in the semiconductor substrate. The generated electrons are collected at the electrode and drawn as electric signals from an output terminal.
1-9. (canceled)
A radiation detection apparatus for detecting radiation based on a charge generated by the incident radiation, comprising:
Dependencies are inferred from the claim text.