Device for Determining Aim Position of Charged Particle Beam, Method of Using the Device, and Treatment Device Employing Device for Determining Aim Position

A device for determining an aim position of a charged particle beam comprising:

• an adjusting unit that adjusts an irradiation position, in a depth direction of an optic axis of an eye to be inspected which is a subject, of an irradiation position determining charged particle beam irradiated from a charged particle beam irradiation source;
• a reflecting unit that transmits or allows the position determining charged particle beam to pass, and reflects a first emitted light emitted from a region of the eye on which the position determining charged particle beam is irradiated and a second emitted light emitted, due to an irradiation of an excitation light, from a region including the region of the eye on which the position determining charged particle beam is irradiated, toward the outside of the axis of the charged particle beam;
• and
• an imaging unit that is arranged at a position where the first emitted light and the second emitted light reflected from the reflecting unit are incident, and images the region including the region of the eye on which the position determining charged particle beam is irradiated by allowing incidence of the first emitted light and the second emitted light.

A treatment device using a charged particle beam comprising:

• an adjusting unit that adjusts an irradiation position, in a depth direction of a subject, of an irradiation position determining charged particle beam irradiated from a charged particle beam source;
• a reflecting unit that transmits or allows the position determining charged particle beam to pass and reflects a first emitted light emitted from a region of the subject on which the position determining charged particle beam is irradiated and a second emitted light emitted, due to an irradiation of an excitation light, from a region including the region of the subject on which the position determining charged particle beam is irradiated, toward the outside of the axis of the charged particle beam;
• and
• an imaging unit that is arranged at a position where the first emitted light and the second emitted light reflected from the reflecting unit are incident and images a region including the region of the subject on which the position determining charged particle beam is irradiated by allowing incidence of the first emitted light and the second emitted light, wherein
• the adjusting unit adjusts, in a plurality of steps, an irradiation position, along a depth direction of a subject, of the position determining charged particle beam irradiated from the charged particle beam irradiation source,
• the imaging unit images, in every step, a region including the region of the subject on which the position determining charged particle beam is irradiated by allowing the first emitted light emitted from the part of the subject on which the position determining charged particle beam is irradiated to be incident on the imaging unit,
• the adjusting unit adjusts the irradiation position of the position determining charged particle beam toward a target position on the basis of an image obtained by the imaging,
• the imaging unit images, by allowing the second emitted light reflected from the reflecting unit to be incident thereon, the region including the region of the subject on which the position determining charged particle beam is irradiated to determine an aim position of a charged particle beam for treatment, and
• the irradiation position determining charged particle beam is switched with the charged particle beam for treatment, and the charged particle beam for treatment is irradiated on the aim position.