Charged particle analyser and method
AssigneeOxford Instruments Nanotechnology Tools Limited
InventorsIan Richard Barkshire, Peter John Statham, Marcus Jacka
Life of this patent
Estimating the term…
Loading patent…
AssigneeOxford Instruments Nanotechnology Tools Limited
InventorsIan Richard Barkshire, Peter John Statham, Marcus Jacka
Estimating the term…
A charged particle analyser (1) comprises a first non-imaging electrostatic lens (8, 9) for receiving charged particles having divergent, trajectories and for converting the said trajectories into substantially parallel trajectories. At least one planar filter (10) is provided for receiving the charged particles having the substantially parallel trajectories and for filtering the charged particles in accordance with their respective energies. A second non-imaging electrostatic lens (11) receives the energy filtered charged particles and selectively modifies their trajectories as a function of their energies. A charged particle detector (12) then receives the charged particles in accordance with their selectively modified trajectories.
A charged particle analyser comprising:
(canceled)
(canceled)
Dependencies are inferred from the claim text.