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US 2010/0163100 A1Published application
Photovoltaic Device and Process for Producing Same
AssigneeMitsubishi Heavy Industries, Ltd.
InventorsSaneyuki Goya, Satoshi Sakai, Kouji Satake
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Abstract
A photovoltaic device with improved cell properties having a photovoltaic layer comprising microcrystalline silicon-germanium, and a process for producing the device. A buffer layer comprising microcrystalline silicon or microcrystalline silicon-germanium, and having a specific Raman peak ratio is provided between a substrate-side impurity-doped layer and an i-layer comprising microcrystalline silicon-germanium.
Claims14
A photovoltaic device having a substrate and a photovoltaic layer provided on top of the substrate,
- the photovoltaic layer including a p-layer comprising a semiconductor doped with a p-type impurity, an n-layer comprising a semiconductor doped with an n-type impurity, and an i-layer comprising mainly microcrystalline silicon-germanium that is provided between the p-layer and the n-layer, wherein
- a buffer layer comprising mainly microcrystalline silicon or microcrystalline silicon-germanium is disposed between a substrate-side impurity-doped layer, which is a layer among the p-layer and the n-layer that is positioned closer to the substrate, and the i-layer, and
- a Raman peak ratio Ic(1)/Ia(1) for the buffer layer, which represents a ratio within a Raman spectroscopic measurement spectrum of a peak intensity Ic(1) of a crystalline phase relative to a peak intensity Ia(1) of an amorphous phase, is not less than 0.8.
A photovoltaic device having a substrate and a photovoltaic layer provided on top of the substrate,
- the photovoltaic layer including a p-layer comprising a semiconductor doped with a p-type impurity, an n-layer comprising a semiconductor doped with an n-type impurity, and an i-layer comprising mainly microcrystalline silicon-germanium that is provided between the p-layer and the n-layer, wherein
- a Raman peak ratio Ic(2)/Ia(2) for a substrate-side impurity-doped layer, which is a layer among the p-layer and the n-layer that is positioned closer to the substrate, is not less than 2, in which the Raman peak ratio Ic(2)/Ia(2) represents a ratio within a Raman spectroscopic measurement spectrum of a peak intensity Ic(2) of a crystalline phase relative to a peak intensity Ia(2) of an amorphous phase.
A process for producing a photovoltaic device comprising formation of a photovoltaic layer on top of a substrate,
- the formation of the photovoltaic layer comprising the steps of:
- forming a p-layer comprising a semiconductor doped with a p-type impurity, an i-layer comprising mainly microcrystalline silicon-germanium, and an n-layer comprising a semiconductor doped with an n-type impurity, either in that sequence or in a reverse sequence,
- and further comprising a step of forming a buffer layer comprising mainly microcrystalline silicon or microcrystalline silicon-germanium, the step being performed between the step of forming a substrate-side impurity-doped layer, which is a layer among the p-layer and the n-layer that is positioned closer to the substrate, and the step of forming the i-layer, wherein
- a Raman peak ratio Ic(1)/Ia(1) for the buffer layer, which represents a ratio within a Raman spectroscopic measurement spectrum of a peak intensity Ic(1) of a crystalline phase relative to a peak intensity Ia(1) of an amorphous phase, is not less than 0.8.
1 more element
A process for producing a photovoltaic device comprising formation of a photovoltaic layer on top of a substrate,
- the formation of the photovoltaic layer comprising the steps of:
- forming a p-layer comprising a semiconductor doped with a p-type impurity, an i-layer comprising mainly microcrystalline silicon-germanium, and an n-layer comprising a semiconductor doped with an n-type impurity, either in that sequence or in a reverse sequence,
- and further comprising a step of forming a buffer layer comprising mainly microcrystalline silicon or microcrystalline silicon-germanium, the step being performed between the step of forming a substrate-side impurity-doped layer, which is a layer among the p-layer and the n-layer that is positioned closer to the substrate, and the step of forming the i-layer, wherein
- in the step of forming the buffer layer, conditions that result in a Raman peak ratio Ic(1)/Ia(1) for the buffer layer, which represents a ratio within a Raman spectroscopic measurement spectrum of a peak intensity Ic(1) of a crystalline phase relative to a peak intensity Ia(1) of an amorphous phase, of not less than 0.8 are determined in advance and used as a basis for formation of the buffer layer.
1 more element
A process for producing a photovoltaic device comprising formation of a photovoltaic layer on top of a substrate,
- the formation of the photovoltaic layer comprising the steps of:
- forming a p-layer comprising a semiconductor doped with a p-type impurity, an i-layer comprising mainly microcrystalline silicon-germanium, and an n-layer comprising a semiconductor doped with an n-type impurity, either in that sequence or in a reverse sequence, wherein
- in the step of forming a substrate-side impurity-doped layer, which is a layer among the p-layer and the n-layer that is positioned closer to the substrate, a Raman peak ratio Ic(2)/Ia(2) of the substrate-side impurity-doped layer, which represents a ratio within a Raman spectroscopic measurement spectrum of a peak intensity Ic(2) of a crystalline phase relative to a peak intensity Ia(2) of an amorphous phase, is not less than 2.
A process for producing a photovoltaic device comprising formation of a photovoltaic layer on top of a substrate,
- the formation of the photovoltaic layer comprising the steps of:
- forming a p-layer comprising a semiconductor doped with a p-type impurity, an i-layer comprising mainly microcrystalline silicon-germanium, and an n-layer comprising a semiconductor doped with an n-type impurity, either in that sequence or in a reverse sequence, wherein
- in the step of forming a substrate-side impurity-doped layer, which is a layer among the p-layer and the n-layer that is positioned closer to the substrate, conditions that result in a Raman peak ratio Ic(2)/Ic(2) for the substrate-side impurity-doped layer, which represents a ratio within a Raman spectroscopic measurement spectrum of a peak intensity Ic(2) of a crystalline phase relative to a peak intensity Ia(2) of an amorphous phase, of not less than 2 are determined in advance and used as a basis for formation of the substrate-side impurity-doped layer.
Dependencies are inferred from the claim text.