Structure and methodology for fabrication and inspection of photomasks
AssigneeInternational Business Machines Corporation
InventorsJed H. Rankin, Andrew J. Watts
Life of this patent
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AssigneeInternational Business Machines Corporation
InventorsJed H. Rankin, Andrew J. Watts
Estimating the term…
A photomask, method of designing, of fabricating, of designing, a method of inspecting and a system for designing the photomask. The photomask, includes: a cell region, the cell region comprising one or more chip regions, each chip region comprising a pattern of opaque and clear sub-regions corresponding to features of an integrated circuit chip and one or more kerf regions, each kerf region comprising a pattern of opaque and clear sub-regions corresponding to features of an integrated circuit kerf; a clear region formed adjacent to a side of a copy region, the copy region comprising opaque and clear sub-regions that are copies of at least a part of the cell region; and an opaque region between the clear region and the cell region.
A method of designing a photomask, comprising:
A computer system comprising a processor, an address/data bus coupled to said processor, and a computer-readable memory unit coupled to communicate with said processor, said memory unit containing instructions that when executed implement a method for method of designing a photomask, said method comprising the computer implemented steps of:
Dependencies are inferred from the claim text.