Apparatus and Method for Investigating Biological Systems and Solid Systems
AssigneeNambition GmbH
InventorsLeif Riemenschneider, Gerd Hoffman
Life of this patent
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Abstract
Proposed is a procedure for carrying out a scanning probe microscopic or atomic force spectroscopic measurement within predetermined parameters, which said procedure encompasses the following steps: a determination of a value variance of at least one of the parameters, and control of an adjustment member in relation to said variance, so that the variance is at least partially compensated for.
Claims27
1-45. (canceled)
A method for carrying out a scanning probe microscopic or atom force spectroscopic measurement using predetermined parameters and comprising the steps:
- the determination of a variation in value of at least one of the parameters, and
- the control of an adjusting member in relation to an already determined variation in value, so that said variation is at least partially, automatically compensated for during a measurement and/or prior to at least one succeeding measurement.
An apparatus for scanning mode microscopy and/or for atomic force spectroscopy comprising:
- measuring equipment, which consists of a probe for scanning probe microscopic and/or atomic force spectroscopic measurements and a sample carrier (7) for the placement of a sample to be measured,
- a position detector (1), which determines the position of a measuring-beam (2), which beam has been reflected from the probe,
- an adjustment element (8), which is designed to move the sample carrier (7),
- an adjustment member, and
- a control, which so regulates the adjustment member relative to a determined value variation in a predetermined parameter, that the variation of value is partially automatically compensated for during a measurement and/or prior to the next measurement.
Dependencies are inferred from the claim text.