Mems sensor with built-in self-test
AssigneeRobert Bosch GmbH
InventorsChristoph Lang, Valdimir Petkov, Udo-Martin Gomez
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AssigneeRobert Bosch GmbH
InventorsChristoph Lang, Valdimir Petkov, Udo-Martin Gomez
Estimating the term…
A method and system for testing a MEMS sensor element during operation of a MEMS sensor system in one embodiment includes a test signal generator configured to generate a broad frequency band test signal, and a verification signal substantially identical to the test signal, a microelectrical-mechanical system (MEMS) sensor element operatively connected to the test signal generator for generating a sensor output in response to the test signal, a comparison component configured to generate an evaluation signal output based upon the verification signal and the test signal, and an evaluation circuit operatively connected to the comparison component and configured to identify a mismatch between the verification signal and the sensor output based upon the evaluation signal.
A MEMS sensor system comprising:
A method of evaluating the response of a sensor element comprising:
A MEMS sensor system comprising:
Dependencies are inferred from the claim text.