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US 2010/0142587 A1Published application
Temperature measurement circuit
OwnerMikihiro Kajitainventor
Life of this patent
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Abstract
A temperature measurement circuit includes a diode including a pair of terminals between which a constant voltage is applied and passing therethrough a current that changes depending on a temperature; and a temperature detection section that detects the temperature based on the current passing through the diode. The temperature measurement circuit measures the temperature with a higher accuracy.
Claims8
A temperature measurement circuit comprising:
- a diode including a pair of terminals between which a constant voltage is applied, said diode passing therethrough a current that changes depending on a temperature;
- and
- a temperature detection section that detects the temperature based on the current passing through said diode.
A semiconductor integrated circuit comprising:
- a diode including a pair of terminals between which a constant voltage is applied, said diode passing therethrough a current that changes depending on a temperature;
- a temperature detection section that detects the temperature based on the current passing through said diode;
- and
- a comparator that compares the temperature detected by said temperature detection section with a specific threshold temperature, to output a signal representing whether or not the temperature detected by said temperature detection section exceeds said threshold temperature.
1 more element
A temperature measurement method comprising:
- applying a constant voltage to a diode passing therethrough a current that changes depending on a temperature;
- and
- detecting the temperature based on the current passing through said diode.
Dependencies are inferred from the claim text.