Loading patent…
AssigneeDijkstra Advice, Research & EMC Electronics B.V.
InventorsPatrick Walter Josef Dijkstra, Antonius Josephus Van Peer
Estimating the term…
In one embodiment of the present invention, a probe for measuring an electrical field is disclosed, including at least one antenna, a detection circuit for each antenna, which detection circuit is connected to the corresponding antenna for detecting an RF signal, and a housing in which is received a processing circuit for processing a detected signal, wherein the housing is conductive and includes at least partially a substantially spherical surface for the purpose of forming a ground plane for the at least one antenna, wherein the detection circuit is arranged outside the housing and is coupled to the processing circuit via a feedthrough capacitor with a feedthrough terminal and a shield, wherein the feedthrough terminal connects the detection circuit conductively to the processing circuit and the shield is connected conductively to the conductive surface of the housing.
Probe for measuring an electrical field, comprising:
Probe as claimed in claim, wherein the resistive layer has a length and a maximum width, wherein the length is measured in the lengthwise direction of the antenna from the first end to the second end, and wherein the maximum width is measured at the first end;
Probe for measuring an electrical field, comprising:
Probe for measuring an electrical field, comprising:
Dependencies are inferred from the claim text.