Electronic device including circuitry comprising open failure-susceptible components, and open failure-actuated anti-fuse pathway

A method of maintaining operability of a series-connected array of microelectronic components susceptible to open state failure in a main circuit, comprising re-routing of current around an open state failed component in said array through an ancillary circuit containing a bypass control element arranged to maintain the ancillary circuit in a non-current flow condition when none of the open failure-susceptible components has experienced open failure, and to reroute current from the main circuit around the open-failed component through the ancillary circuit and back to the main circuit in the event of an open failure, to bypass the open-failed component so that all non-failed series components of the main circuit remain operative when electrically energized.

An electronic device, including series-connected open failure-susceptible components in a main circuit, and open failure-actuated current flow components that in the event of open failure are actuated to effect current flow around an open failed component to the main circuit to continue operation of non-failed components in the series array.

An electronic device, comprising:

• a series-connected array of open failure-susceptible electronic components;
• and
• a plurality of anti-fuse assemblies, each of which is coupled to a respective one of said electronic components in a series-connected array, wherein each anti-fuse assembly includes an actuating material layer in contact with each of at least two conductive elements that do not contact one another, wherein the actuating material layer under non-open failure electrical conditions of operation of said failure-susceptible electronic components does not conduct current between said at least two conductive elements, and wherein the actuating material layer under open failure electrical conditions of operation of said failure-susceptible electronic components conducts current between said at least two conductive elements, to bypass an open failed component of said series-connected array of open failure-susceptible electronic components.