Process for production of silicon single crystal, and silicon single crystal substrate
AssigneeSumco Techxiv Corporation
InventorsShinichi Kawazoe, Toshimichi Kubota, Yasuhito Narushima, Fukuo Ogawa
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AssigneeSumco Techxiv Corporation
InventorsShinichi Kawazoe, Toshimichi Kubota, Yasuhito Narushima, Fukuo Ogawa
Estimating the term…
In growing a silicon monocrystal from a silicon melt added with an N-type dopant by Czochralski method, the monocrystal is grown such that a relationship represented by a formula (1) as follows is satisfied. In the formula (1): a dopant concentration in the silicon melt is represented by C (atoms/cm3); an average temperature gradient of the grown monocrystal is represented by Gave(K/mm); a pulling-up speed is represented by V (mm/min); and a coefficient corresponding to a kind of the dopant is represented by A. By growing the silicon monocrystal under a condition shown in the left to a critical line G1, occurrence of abnormal growth due to compositional supercooling can be prevented. Gave V > A · C - 43 ( 1 )
A method of manufacturing a silicon monocrystal, the silicon monocrystal being grown from a silicon melt added with an N-type dopant by Czochralski method, the method comprising growing the monocrystal such that a relationship represented by a formula (1) as follows is satisfied, where:
A silicon monocrystal substrate, obtained from a silicon monocrystal grown from a silicon melt added with an N-type dopant by Czochralski method, the monocrystal being grown such that a relationship represented by a formula (2) as follows is satisfied, where:
Dependencies are inferred from the claim text.