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US 2010/0100577 A1Published application
Methods and systems for analysis of multi-sample, two-dimensional data
AssigneeIntelliscience Corporation
InventorsNicholas L. Middleton, Bryan G. Donaldson, Robert L. Bass, II, Anamika Saxena
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Abstract
The present invention utilizes a pattern extraction methodology to elucidate significant patterns and mathematical relationships that exist between and among pluralities of two-dimensional sample data sets of the same data type. In one instance, the present invention analyzes multi-sample, two-dimensional mass spectroscopy data, while in an alternate instance, another user-specified, preset, or automatically determined data type, modality, submodality, etc., is analyzed.
Claims6
A system for use in analysis of two-dimensional data, the system comprising:
- a computer having a processor, a display, and a memory, the processor being configured to operate programming instructions stored in the memory to:
- access a first set of two-dimensional data, the first set comprising a plurality of data points each representing a series of points having a locus X-value and a corresponding locus Y-value;
- and
- analyze the first set of two dimensional data to determine the presence of a first data set pattern at a determined locus X-value by developing a list of loci X-values and corresponding loci Y-values, the loci X-values being confined to a determined range including the locus X-value, the list further comprising data points drawn from the first set and excluding data points from the first set for which the Y-value is less than a determined tolerance value, the list further including only those data points for which a common mathematical relationship is found to be present.
1 more element
Dependencies are inferred from the claim text.