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US 2010/0076724 A1Published application
Method for capturing and analyzing test result data
OwnerHarold Lee Brown, Phillip A. Justiceinventors
Life of this patent
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Abstract
A method, system, and graphical user interface display for an efficient and effective characterization and analysis of test data for diverse products from a wide variety of industries using both successful test data and failure test data.
Claims2
A method for data analysis comprising the steps of:
- a) Providing test data;
- b) Selecting either pass only data or all data;
- c) processing the selected data;
- and
- d) displaying either the mean, standard deviation, lower Z-score, upper Z-score, yield, and defects per unit or the parts per million and defects per unit.
2 more elements
A method for data analysis comprising the steps of:
- a) Collecting and aggregating data files;
- b) Loading statistical analysis software;
- c) Initiating software and displaying software graphical user interface of a resource tab;
- d) Loading parser;
- e) Selecting data files to be processed;
- f) Displaying of selected data files in the graphical user interface;
- g) Selecting data files for optional removal;
- h) Optionally removing selected data files for optional removal;
- i) Optionally removing all data files and returning to step e above or termination software;
- j) Importing data files for parsing;
- k) Parsing data files by extracting and storing product part name into a data storage unit;
- l) Parsing data files by extracting and storing product part number into the data storage unit;
- m) Parsing data files by extracting and storing product part number revision level into the data storage unit;
- n) Parsing data files by extracting and storing product serial number into the data storage unit;
- o) Parsing data files by extracting and storing number of test failures into the data storage unit;
- p) Parsing data files by extracting and storing test status into the data storage unit;
- q) Parsing data files by extracting and storing test environment into the data storage unit;
- r) Parsing data files by extracting and storing test start time into the data storage unit;
- s) Parsing data files by extracting and storing test end time into the data storage unit;
- t) Parsing data files by extracting and storing operator information into the data storage unit;
- u) Parsing data files by extracting and storing generation time and date into the data storage unit;
- v) Parsing data files by extracting and storing test number into the data storage unit;
- w) Parsing data files by extracting and storing test description into the data storage unit;
- x) Parsing data files by extracting and storing data status into the data storage unit;
- y) Parsing data files by extracting and storing continuous data lower specification limit into the data storage unit;
- z) Parsing data files by extracting and storing continuous data upper specification limit into the data storage unit;
- aa) Parsing data files by extracting and storing actual measured values into the data storage unit;
- bb) Parsing data files by extracting and storing expected values into the data storage unit;
- cc) Parsing data files by extracting and storing attribute actual values into the data storage unit;
- dd) Parsing data files by extracting and storing data type into the data storage unit;
- ee) Parsing data files by extracting and storing parameters units into the data storage unit;
- ff) Parsing data files by extracting and storing pass/fail field into the data storage unit;
- gg) Repeat steps k-ff for each data file selected;
- hh) Updating graphical user interface display information;
- ii) Selecting a data processing method from either all data or passed data only;
- jj) For all data, characterizing and analyzing the entire data set;
- kk) For pass data only, characterizing and analyzing passed data only within the specification limits for continuous data;
- ll) Selecting a scoring method from individual or grouped;
- mm) For individual scoring;
- a separate scorecard is produced for each selected product part number with its respective revision level;
- nn) For grouped scoring;
- a single scorecard is produced for all selected product part numbers with their respective revision levels;
- oo) Determining if continuous or attribute data is being processed;
- pp) For continuous data, calculating each parameter's mean and store into the data storage unit;
- qq) For continuous data, calculating each parameter's standard deviation and store into the data storage unit;
- rr) For continuous data, calculating each parameter's upper Z-Score or Z-Value and store into the data storage unit;
- ss) For continuous data, calculating each parameter's lower Z-Score or Z-Value and store into the data storage unit;
- tt) For continuous data, calculating each parameter's yield and store into the data storage unit;
- uu) For attribute data, calculating each parameters parts per million and store into the data storage unit;
- vv) For attribute data, calculating each parameters defects per unit and store into the data storage unit;
- ww) Calculating the total number of parameter for each product part number that were processed;
- xx) Calculating the total number of product files for each product part number that were processed;
- yy) Calculating the long-term sigma score for each product part number that were processed;
- zz) Calculating the short-term sigma score for each product part number that were processed;
- aaa) Calculating the total number of defects per unit for each product part number;
- bbb) Displaying scorecard or scorecards;
- each scorecard comprising:
- ccc) For continuous data;
- specification limits, the actual measured data mean, standard deviation, Z-Lower and Z-Upper, Yield, defects per unit (DPU), and sigma shift factor;
- ddd) For attribute data;
- defects per unit and parts per million;
- eee) Determining whether to store the statistical results externally;
- fff) Terminating software.
60 more elements
Dependencies are inferred from the claim text.