Method for producing semiconductor device and semiconductor producing apparatus
AssigneePanasonic Corporation
InventorsYuichiro Sasaki, Katsumi Okashita, Keiichi Nakamoto, Hiroyuki Ito, Bunji Mizuno
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Abstract
A plasma of a gas containing an impurity is produced through a discharge in a vacuum chamber, and a plurality of substrates are successively doped with the impurity by using the plasma, wherein a plasma doping condition of a subject substrate is adjusted based on an accumulated discharge time until the subject substrate is placed in the vacuum chamber.
Claims22
A method for producing a semiconductor device, in which a plasma of a gas containing an impurity is produced through a discharge in a vacuum chamber, and a plurality of substrates are successively doped with the impurity by using the plasma,
- wherein a plasma doping condition of a subject substrate is adjusted based on an accumulated discharge time until the subject substrate is placed in the vacuum chamber.
A method for producing a semiconductor device, in which a plasma of a gas containing an impurity is produced through a discharge in a vacuum chamber, and an impurity region is formed in a surface of a substrate by exposing the substrate to the plasma, the method comprising:
- a step (a) of setting a first plasma doping condition being a reference condition;
- a step (b) of correcting the first plasma doping condition to set a second plasma doping condition so that a dose of the impurity to be introduced into the substrate becomes equal to a target value, based on an accumulated discharge time until the substrate is placed in the vacuum chamber;
- and
- a step (c) of plasma-doping the substrate with the impurity under the second plasma doping condition set in the step (b) to form the impurity region.
A semiconductor producing apparatus for forming an impurity region in a surface of a substrate by exposing the substrate to a plasma of a gas containing an impurity, the semiconductor producing apparatus comprising:
- a vacuum chamber;
- a gas supplying section for supplying the gas into the vacuum chamber;
- an exhausting section for exhausting the vacuum chamber;
- a plasma generating section for making the gas supplied into the vacuum chamber by the gas supplying section into a plasma through a discharge;
- and
- a plasma doping condition control section for controlling a plasma doping condition,
- wherein the plasma doping condition control section sets a first plasma doping condition being a reference condition, and corrects the first plasma doping condition to set a second plasma doping condition so that a dose of the impurity to be introduced into the substrate becomes equal to a target value, based on an accumulated discharge time until the substrate is placed in the vacuum chamber.
Dependencies are inferred from the claim text.