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AssigneeSamsung Electronics Co., Ltd.
InventorsHaibing Ren, Jung Bae Kim, Jong Ha Lee
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Provided are a detector and a method of detecting an object using the detector. The method includes combining a first detector and a second detector in a combination scheme to form a multi-layer combination detector, the second detector being of a type different from that of the first detector, processing a binary classification detection with respect to an inputted sample starting from an uppermost layer detector, allowing a sample of an object detected from a current layer to approach a lower layer, while rejecting a sample of a non-object detected from the current layer whereby the rejected non-object may not approach the lower layer, and outputting a sample passing through all layers as a detected object.
A method of detecting an object using a combination detector including a processor having executable instructions, the method comprising:
A method of detecting an object using a combination detector including a processor having executable instructions, the method comprising:
A combination detector, in which a first detector and a second detector, the second detector being of a type different from that of the first detector, are combined, a binary classification detection with respect to an inputted sample is processed, a sample of an object detected from a current layer is allowed to approach a lower layer, a sample of a non-object detected from the current layer is rejected from approaching the lower layer, and a sample passing through all layers is outputted as a detected object.
A combination detector, in which a first detector and a second detector, the second detector being a type different from that of the first detector, are combined, a plurality of appearance images are classified into a plurality of sub classes in accordance with a viewing angle, a binary classification detection is processed with respect to an inputted sample of the plurality of sub classes, a sample of an object detected from a current layer is allowed to approach a lower layer, a sample of a non-object detected from the current layer is rejected from approaching the lower layer, and final samples passing through all layer are combined as a detected object.
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