Visible-region light measuring instrument and visible-region light measuring instrument manufacturing method
AssigneeOki Semiconductor Co., Ltd.
InventorTadashi Chiba
Life of this patent
Estimating the term…
Loading patent…
AssigneeOki Semiconductor Co., Ltd.
InventorTadashi Chiba
Estimating the term…
There is provided a visible-region light measuring instrument including: a first photodiode and a second photodiode. At least one of the first photodiode and the second photodiode comprises plural photodiodes, when the first photodiode comprises a first plural photodiodes, the visible-region light measuring instrument has first fuses that control connections between the first plural photodiodes and at least one of the first node and the first power supply node. When the second photodiode comprises a second plural photodiodes, the visible-region light measuring instrument has second fuses that control connections between the second plural photodiodes and at least one of the first node and the second power supply node.
A visible-region light measuring instrument comprising:
Dependencies are inferred from the claim text.