Cleaning and testing ionic cleanliness of electronic assemblies

A method for cleaning and testing electronic assemblies, the method comprising:

• loading one or more electronic assemblies into a cleaning/testing apparatus;
• contacting the one or more electronic assemblies with one or more solvents;
• measuring the resistivity of the one or more solvent after contact with the electronic assemblies;
• comparing the resistivity of the one or more solvents after contact with the electronic assemblies with an original resistivity of the one or more solvents before contact with the electronic assemblies;
• and
• determining the amount of ionic residues on the electronic assemblies based upon the comparing.

A process for testing electronic assemblies, the process comprising:

• providing a testing apparatus, wherein the testing apparatus comprises:
• a cleaning/testing area for receiving one or more electronic assemblies;
• a resistivity sensor;
• a processor;
• and
• a memory;
• receiving one or more electronic assemblies into the cleaning/testing area;
• initiating a cleaning cycle;
• cleaning the one or more electronic assemblies;
• initiating a testing cycle;
• contacting the one or more electronic assemblies with one or more solvents;
• measuring the resistivity, via the resistivity sensor, of the one or more solvents after contact with the one or more electronic assemblies;
• comparing the resistivity of the one or more solvents after contact with the one or more electronic assemblies with an original resistivity of the one or more solvents before contact with the one or more electronic assemblies;
• determining, via the processor and the memory, the amount of ionic residues on the one or more electronic assemblies based upon the comparing;
• and
• drying the one or more electronic assemblies in the cleaning/testing area.