Instrumentation of midp applications for one-device testing
AssigneeSun Microsystems, Inc.
InventorsRoman Zelov, Alexander Glasman, Mikhail A. Gorshenev
Life of this patent
Estimating the term…
Loading patent…
AssigneeSun Microsystems, Inc.
InventorsRoman Zelov, Alexander Glasman, Mikhail A. Gorshenev
Estimating the term…
A method for testing a MIDlet application with a test application includes a step of modifying the MIDlet application to form a modified MIDlet application which allows the test application to access one or more functions, variables, or classes from the MIDlet application. The MIDlet application is then bundled with the test application to form a testable MIDlet application. The testable MIDlet application is executed on a MIDlet capable device or a MIDlet-capable device emulator and test results are collected. A system executing the method is also provided.
A method for testing a MIDlet application with a test application, the method comprising:
A method for testing a MIDlet application with a test application, the method comprising:
A system for testing a MIDlet application with a test application, the system including a microprocessor operable to execute the following steps:
Dependencies are inferred from the claim text.