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US 2009/0267633 A1Published application
Semiconductor device and test method thereof
AssigneeHynix Semiconductor Inc.
InventorJun-Hyun CHUN
Life of this patent
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Abstract
A semiconductor device includes: a command control circuit for decoding a command signal to output a test signal and a normal control signal; a normal circuit for performing a predetermined operation in response to the normal control signal; and a test circuit for testing electrical characteristics of unit elements provided in the normal circuit in response to the test signal.
Claims11
1-19. (canceled)
A semiconductor device, comprising:
- a test signal generator configured to generate a plurality of test signals;
- a plurality of first unit elements configured to be corresponding to a plurality of second unit elements arranged in a normal circuit;
- a plurality of unit testers configured to selectively test electrical characteristics of the plurality of first unit elements to output a plurality of test control signals in response to the plurality of test signals, respectively.
Dependencies are inferred from the claim text.