Physical Property Measuring Method for TFT Liquid Crystal Panel and Physical Property Measuring Apparatus for TFT Liquid Crystal Panel

A physical property measuring method for a TFT liquid crystal panel, comprising:

• an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value;
• a voltage application step of applying a voltage that cyclically varies to an auxiliary capacitor electrically connected with a liquid crystal layer of the TFT liquid crystal panel in parallel;
• and
• a physical property measuring step of measuring a transient current flowing through the auxiliary capacitor to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the auxiliary capacitor.

A physical property measuring method for a TFT liquid crystal panel, comprising:

• a step of applying a predetermined voltage to the gate electrode of a TFT in the liquid crystal panel;
• a step of writing a pulse voltage in a liquid crystal layer of the TFT liquid crystal panel;
• and
• a step of detecting a change in potential in the liquid crystal layer having the pulse voltage written therein to measure a voltage holding ratio in the liquid crystal layer.

A physical property measuring method for a TFT liquid crystal panel, comprising:

• an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value;
• a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel and an auxiliary capacitor that is electrically connected with the liquid crystal layer in parallel;
• and
• a physical property measuring step of measuring a combined current of a transient current flowing through the liquid crystal layer and a transient current flowing through the auxiliary capacitor to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties as a combination of characteristics of the liquid crystal layer and characteristics of the auxiliary capacitor.

A physical property measuring method for a TFT liquid crystal panel, comprising:

• a step of applying a predetermined voltage to the gate electrode of a TFT of the TFT liquid crystal panel;
• a step of writing a pulse voltage in a liquid crystal layer of the TFT liquid crystal panel and an auxiliary capacitor electrically connected with the liquid crystal layer in parallel;
• and
• a step of detecting a change in combined potential of the liquid crystal layer and the auxiliary capacitor having the pulse voltage written therein to measure a combined voltage holding ratio in the liquid crystal layer and the auxiliary capacitor.

A physical property measuring apparatus for a TFT liquid crystal panel, comprising:

• a triangular wave generating unit that applies a triangular wave voltage to a liquid crystal layer of the TFT liquid crystal panel;
• a measuring unit that measures a transient current flowing through the liquid crystal layer to which the triangular wave voltage is applied by the triangular wave generating unit;
• and
• a gate potential holding unit that applies a predetermined voltage to the gate electrode of a TFT of the TFT liquid crystal panel.

A physical property measuring apparatus for a TFT liquid crystal panel, comprising:

• a pulse voltage application circuit that writes a pulse voltage in a liquid crystal layer of the TFT liquid crystal panel;
• a potential change detection circuit that detects a change in potential in the liquid crystal layer to which the pulse voltage is applied by the pulse voltage application circuit to measure a voltage holding ratio in the liquid crystal layer;
• and
• a gate potential holding unit that applies a predetermined voltage to the gate electrode of a TFT of the TFT liquid crystal panel.

A physical property measuring method for a liquid crystal layer in a TFT liquid crystal panel, comprising:

• a setting step of connecting a current measuring unit to a data line associated with a TFT in a physical property measurement target region of the TFT liquid crystal panel and maintaining a potential of a gate line associated with the TFT in the physical property measurement target region at a predetermined potential;
• a voltage application step of applying a voltage that cyclically varies to the liquid crystal layer in the physical property measurement target region;
• and
• a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.

A physical property measuring method for a TFT liquid crystal panel, comprising:

• a setting step of connecting a current measuring unit to a data line associated with a TFT in a physical property measurement target region of the TFT liquid crystal panel and maintaining a potential of a gate line associated with the TFT in the physical property measurement target region at a predetermined potential;
• a voltage application step of applying a voltage that cyclically varies to an auxiliary capacitor electrically connected with a liquid crystal layer in the physical property measurement target region in parallel;
• and
• a physical property measuring step of measuring a transient current flowing through the auxiliary capacitor to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the auxiliary capacitor.

A physical property measuring apparatus for a liquid crystal layer in a TFT liquid crystal panel, comprising:

• a constant voltage source that applies a predetermined voltage to the gate of a TFT in a physical property measurement target region of the TFT liquid crystal panel;
• a voltage application unit that writes a pulse voltage in the liquid crystal layer of the TFT liquid crystal panel in the physical property measurement target region;
• a measuring unit that detects a change in potential in the liquid crystal layer having the pulse voltage written therein to measure a voltage holding ratio in the liquid crystal layer;
• and
• a feedback unit that feeds back an output from a source of the TFT in the physical property measurement target region to the voltage application unit when measuring the voltage holding ratio by the measuring apparatus.

A physical property measuring apparatus for a TFT liquid crystal panel, comprising:

• a gate potential holding unit that maintains a potential of a gate line associated with a TFT in a physical property measurement target region of the TFT liquid crystal panel to a predetermined potential;
• a triangular wave generating unit that applies a triangular wave voltage to a liquid crystal layer of the TFT liquid crystal panel;
• and
• a current measuring unit that is connected with a data line associated with the TFT in the physical property measurement target region and measures a transient current flowing through the liquid crystal layer to which the triangular wave voltage is applied by the triangular wave generating unit.