Semiconductor device
AssigneeKabushiki Kaisha Toshiba
InventorsKosuke Tstsumura, Masakazu Goto, Reika Ichihara, Masato Koyama, Shigeru Kawanaka, Kazuaki Nakajima
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AssigneeKabushiki Kaisha Toshiba
InventorsKosuke Tstsumura, Masakazu Goto, Reika Ichihara, Masato Koyama, Shigeru Kawanaka, Kazuaki Nakajima
Estimating the term…
A semiconductor device includes a semiconductor substrate, a p-channel MIS transistor formed on the substrate, the p-channel transistor having a first gate dielectric formed on the substrate and a first gate electrode layer formed on the first dielectric, and an n-channel MIS transistor formed on the substrate, the n-channel transistor having a second gate dielectric formed on the substrate and a second gate electrode layer formed on the second dielectric. A bottom layer of the first gate electrode layer in contact with the first gate dielectric and a bottom layer of the second gate electrode layer in contact with the second gate dielectric have the same orientation and the same composition including Ta and C, and a mole ratio of Ta to a total of C and Ta, (Ta/(Ta+C)), is larger than 0.5.
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.