Polishing method and polishing apparatus, and program for controlling polishing apparatus
AssigneeEbara Corporation
InventorsTsuneo Torikoshi, Kuniaki Yamaguchi
Life of this patent
Estimating the term…
Loading patent…
AssigneeEbara Corporation
InventorsTsuneo Torikoshi, Kuniaki Yamaguchi
Estimating the term…
A polishing method can bring a polishing surface to the optimum condition for polishing, without using a dummy wafer or the like, before resuming polishing, thereby eliminating the cost of dummy wafer or the like. The polishing method comprises: carrying out a stand-by operation during a polishing-resting time period; carrying out a preparatory process to polishing, after completion of the stand-by operation, by dressing a polishing surface while supplying a polishing liquid to the polishing surface; and starting polishing of a workpiece after completion of the preparatory process to polishing. Determination as to whether to carry out the preparatory process to polishing after completion of the stand-by operation may be made based on the total operating time of the stand-by operation or the total effective number of the stand-by operations.
A polishing method comprising:
A polishing apparatus comprising:
A program for controlling a polishing apparatus to perform operation of:
Dependencies are inferred from the claim text.