US 2009/0260863 A1 · Parallel Test Fixture for Mixed Signal Integrated Circuits

Abstract

The present invention provides a parallel test fixture for mixed signal integrated circuits (ICs). The fixture includes a multi-layer printed circuit board (PCB). The fixture comprises: a test area, which is disposed on a central area of the multi-layer PCB and includes several test regions for a plurality of mixed signal ICs; an analog signal ground layer, which is operationally connected with the analog signals of the mixed signal ICs in the test area; and a digital signal ground layer, which is operationally connected with the digital signals of the mixed signal ICs in the test area. Thereby, when a plurality of mixed signal ICs are parallel tested, not only the problem due to cross-talk could be solved but also the numbers of the layers of the multi-layer PCB could be reduced effectively.

Claims20

Dependent claims

A parallel test fixture for mixed signal integrated circuit, wherein said fixture having a multi-layer printed circuit board, and said fixture comprising:

a test area, which is disposed on a central area of the multi-layer printed circuit board and includes several test regions for a plurality of mixed signal integrated circuits;
an analog signal ground layer, which is operationally connected with a plurality of analog signals of said mixed signal integrated circuits in the test area;
and
a digital signal ground layer, which is operationally connected with a plurality of digital signals of said mixed signal integrated circuits in the test area.

1 more element

A parallel test fixture for mixed signal integrated circuit, wherein said fixture having a multi-layer printed circuit board, and said fixture comprising:

a test area, which is disposed on a central area of the multi-layer printed circuit board and includes test regions for a plurality of mixed signal integrated circuits;
an analog signal layer, which is one layer of the multi-layer printed circuit board for transforming analog signal, and operationally connecting to a plurality of analog signals of said test area;
an analog signal ground layer, which is one layer of the multi-layer printed circuit board, and operationally connects with a plurality of analog signals of said analog signal layer and said test area to form a circuit;
a digital signal layer, which is one layer of the multi-layer printed circuit board for transforming digital signal, and operationally connecting to a plurality of digital signals of said test area;
and
a digital signal ground layer, which is one layer of the multi-layer printed circuit board, and operationally connects with a plurality of digital signals of said digital signal layer and said test area to form a circuit.

3 more elements

Dependencies are inferred from the claim text.

Parallel Test Fixture for Mixed Signal Integrated Circuits

Life of this patent

Parallel Test Fixture for Mixed Signal Integrated Circuits

Life of this patent

Abstract

Claims20