Fatigue test apparatus for thin element of electronic device
AssigneesShenzhen Futaihong Precision Industry Co., Ltd., FIH (Hong Kong) Limited
InventorsLEI LI, PING CHEN, ZHI-QIANG JIANG, CHUN-YING WANG, XUE-LIANG ZHAI, LI-PING HUANG, ZHI CHENG, CHANG-FA SUN, XIAN-CUI DU
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