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US 2009/0260450 A1Published application
Method for measuring the creep of a thin film inserted between two rigid substrates, with one cantilever end
AssigneeCommissariat a l'Energie Atomique
InventorsCecile Petitdidier, Raluca Tiron, Benedicte Mortini
Life of this patent
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Abstract
A film is inserted between two rigid substrates which form a sample. The sample is fixed at a first end in a device for measuring creep. The device comprises means for applying a predetermined force on a free end of the sample. The film being sheared, study of its creep can be performed.
Claims6
A method for measuring the viscoelastic properties of a film inserted between two rigid substrates forming a sample comprising a first end fixed in a measuring device, the method comprising:
- applying a force on a predetermined area of the sample, wherein said force is applied on a free end of the sample,
- measuring the creep of the film and
- determining a characteristic temperature of said film.
Dependencies are inferred from the claim text.