Measuring Head for Nanoindentation Instrument and Measuring Method Using Same

A measuring head for a nano-indentation instrument having positioning means capable of positioning a sample relatively to said measuring head, which comprises:

• a measuring axis attached to a frame intended to be connected to said instrument, incorporating first actuating means and including an indentor;
• means for detecting a depth of penetration of said indentor in said sample;
• and,
• a reference axis also attached to said frame, incorporating second actuating means and including a reference tip;
• wherein said measuring axis and said reference axis each comprise means for detecting a force applied by said first and second actuating means,
• and wherein detection of said penetration depth is performed by measuring a displacement of said indentor relatively to said reference tip.