Semiconductor device
AssigneeNEC Electoronics Corporation
InventorsHiromichi Takaoka, Yoshitaka Kubota, Niroshi Tsuda
Life of this patent
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AssigneeNEC Electoronics Corporation
InventorsHiromichi Takaoka, Yoshitaka Kubota, Niroshi Tsuda
Estimating the term…
A semiconductor device (200) includes: an electrical fuse (100) including: a lower layer interconnect (120) formed on a substrate; a via (130) provided on the lower layer interconnect (120) so as to be connected to the lower layer interconnect (120); and an upper layer interconnect (110) provided on the via (130) so as to be connected to the via (130), the electrical fuse being cut, in a state after being cut, through formation of a flowing-out portion, the flowing-out portion being formed when an electrical conductor forming the upper layer interconnect (110) flows outside the upper layer interconnect (110); and a guard upper layer interconnect (152) (conductive heat-absorbing member) formed in at least the same layer as the upper layer interconnect (110), for absorbing heat generated in the upper layer interconnect (110).
A semiconductor device, comprising:
Dependencies are inferred from the claim text.