Leakage current analyzing apparatus, leakage current analyzing method, and computer product

A leakage current analyzing apparatus comprising:

• an acquiring unit that acquires a probability density distribution that represents a first variation component specific to each cell in a circuit to be designed and concerning a gate length of a transistor constituting a cell, and a discrete probability density distribution that represents a second variation component common to all the cells of the circuit and concerning the gate length;
• a calculating unit that, based on the probability density distribution and the discrete probability density distribution acquired by the acquiring unit and a function model that expresses leakage current variation of a cell as a product of the first variation component and the second variation component, calculates a cumulative probability density for a leakage current value of the circuit, the leakage current value being less than or equal to an arbitrary leakage current value;
• and
• an output unit that, for each arbitrary leakage current value, outputs the cumulative probability density calculated at the calculating.

A leakage current analyzing method comprising:

• acquiring a probability density distribution that represents a first variation component specific to each cell in a circuit to be designed and concerning a gate length of a transistor constituting a cell, and a discrete probability density distribution that represents a second variation component common to all the cells of the circuit and concerning the gate length;
• calculating, based on the probability density distribution and the discrete probability density distribution acquired at the acquiring and a function model that expresses leakage current variation of a cell as a product of the first variation component and the second variation component, a cumulative probability density for a leakage current value of the circuit, the leakage current value of the circuit being less than or equal to an arbitrary leakage current value;
• and
• outputting, for each arbitrary leakage current value, the cumulative probability density calculated at the calculating.