Manufacturing method of semiconductor device
AssigneeHitachi, Ltd.
InventorsTadashi Arai, Shinichi Saito
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AssigneeHitachi, Ltd.
InventorsTadashi Arai, Shinichi Saito
Estimating the term…
When a thin film transistor is manufactured by using a printing method, the precision of alignment between a first electrode and a second electrode becomes a problem. If it is manufactured by using photolithography, a photomask for each layer is necessary, resulting in the cost being increased. The essence of the present invention is that not only processing the gate shape is carried out over the substrate by using a resist pattern formed by exposing using a photo-mask for the gate pattern but also processing the source-drain electrodes is carried out by lifting-off. As a result, alignment between the source-drain electrode and the gate electrode is carried out.
A manufacturing method of a semiconductor device comprising the steps of:
Dependencies are inferred from the claim text.