Mems device and method of making same
AssigneeHoneywell International Inc.
InventorsJeff A. Ridley, Robert Higashi, James F. Detry
Life of this patent
Estimating the term…
Abstract
A MEMS device includes a P-N device formed on a silicon pin, which is connected to a silicon sub-assembly, and where the P-N device is formed on a silicon substrate that is used to make the silicon pin before it is embedded into a first glass wafer. In one embodiment, forming the P-N device includes selectively diffusing an impurity into the silicon pin and configuring the P-N device to operate as a temperature sensor.
Claims18
A MEMS device comprising:
- a MEMS component attached to a glass wafer;
- a silicon pin in signal communication with the MEMS component, the silicon pin having one end portion located proximate an exterior surface of the glass wafer;
- and
- a temperature sensor attached to the one end portion of the silicon pin, the temperature sensor configured detect a temperature of the MEMS component, the temperature sensor comprising a P-N device located on the one end portion of the silicon pin and formed by selective diffusion before, wherein the P-N device is created before the forming of the silicon pin and before the silicon pin is embedded into the glass wafer.
A MEMS device comprising:
- a glass wafer;
- a silicon sub-assembly coupled to the glass wafer, the silicon sub-assembly having at least one movable mechanical device;
- a conductive element positioned within the glass wafer and located proximate the silicon sub-assembly;
- a silicon pin includes a first end coupled to the conductive element and extends substantially perpendicular from the conductive element, the silicon pin further includes a second end located proximate an exterior surface of the glass wafer;
- and
- a P-N device located on the second end of the silicon pin and formed by selective diffusion, wherein the P-N device is created before the forming of the silicon pin and before the silicon pin is embedded into the glass wafer.
The MEMS device of claim 8, wherein the silicon sub-assembly is made from a single crystal silicon structure.
The MEMS device of claim 8, wherein the glass wafer is made from a high thermal shock resistant glass material.
A method for making a MEMS device, the method comprising:
- making a silicon sub-assembly having at least one movable mechanical device;
- positioning a conductive element proximate the silicon sub-assembly;
- growing an epitaxial layer onto a silicon substrate to form at least one P-N device;
- etching a silicon pin from the silicon substrate, a first end of the silicon pin coupled to the conductive element and a second end of the silicon pin located distally therefrom;
- and
- after forming the P-N device and the silicon pin, embedding at least a portion of the silicon pin within a glass wafer while the at least a surface of the P-N device remains uncovered by the glass wafer.
A method for making a MEMS device, the method comprising:
- making a first glass wafer with appropriate cavities and conductive elements;
- making a silicon sub-assembly;
- bonding at least a portion of the silicon sub-assembly to the first glass wafer;
- growing an appropriately doped epitaxial layer into a silicon wafer to make a P-N device;
- etching the silicon wafer to form silicon pins, at least one silicon pin having the P-N device formed on a first end of the silicon pin;
- embedding the silicon pins into at least the first glass wafer;
- polishing off the non-embedded part of the silicon pins;
- and
- positioning a conductive element proximate the first glass wafer with the embedded silicon pins extending substantially perpendicular from the conductive element, the first end of the silicon pin having the P-N device located distally from a second end of the silicon pin coupled to the conductive element.
A method for making a MEMS device, the method comprising:
- making a first glass wafer with appropriate cavities and conductive elements;
- making a silicon sub-assembly;
- bonding at least a portion of the silicon sub-assembly to the first glass wafer;
- selectively diffusing impurities into a silicon wafer to make a P-N device;
- etching the silicon wafer to form silicon pins, at least one silicon pin having the P-N device formed on a first end of the silicon pin;
- embedding the silicon pins into at least the first glass wafer;
- polishing off the non-embedded part of the silicon pins;
- and
- positioning a conductive element proximate the first glass wafer with the embedded silicon pins extending substantially perpendicular from the conductive element, the first end of the silicon pin having the P-N device located distally from a second end of the silicon pin coupled to the conductive element.
Dependencies are inferred from the claim text.