Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation method

A gas field ionization ion source, comprising:

• a needle-shaped anode emitter;
• and
• an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted;
• wherein the extraction electrode can be separated into an aperture-forming part having an aperture for letting extracted ions pass therethrough, and a base part on which the aperture-forming part is mounted, and
• wherein the aperture-forming part can be withdrawn from and set around the optical axis of ions.

A gas field ionization ion source, comprising:

• a needle-shaped anode emitter;
• and
• an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted;
• wherein the distance from the apex of the emitter to the extraction electrode can be set to any of at least two different values.

A gas field ionization ion source, comprising:

• a needle-shaped anode emitter;
• and
• an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted;
• wherein a cooling substance for cooling the emitter is a solid-state substance obtained by solidifying a refrigerant gas which is in the gaseous state under room temperature and atmospheric pressure conditions.

A scanning charged particle microscope, comprising:

• a gas field ionization ion source having a needle-shaped anode emitter, and an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted, wherein the diameter of the extraction electrode's aperture for letting extracted ions pass therethrough can be set to any of at least two different values;
• a lens system by which ions from the ion source are accelerated and focused on a specimen;
• a limiting apparatus plate for limiting the ions which are focused on the specimen;
• and
• a charged particle detector to detect charged particles emitted from the specimen.

A scanning charged particle microscope, comprising:

• a gas field ionization ion source having a needle-shaped anode emitter, and an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted, wherein the extraction electrode can be separated into an aperture-forming part having an aperture for letting extracted ions pass therethrough, and a base part on which the aperture-forming part is mounted, wherein the aperture-forming part can be withdrawn from and set around the optical axis of ions;
• a lens system by which ions from the ion source are accelerated and focused on a specimen;
• a limiting apparatus plate for limiting the ions which are focused on the specimen;
• and
• a charged particle detector to detect charged particles emitted from the specimen.

A scanning charged particle microscope, comprising:

• a gas field ionization ion source having a needle-shaped anode emitter, and an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted, wherein the distance from the apex of the emitter to the extraction electrode can be set to any of at least two different values;
• a lens system by which ions from the ion source are accelerated and focused on a specimen;
• a limiting apparatus plate for limiting the ions which are focused on the specimen;
• and
• a charged particle detector to detect charged particles emitted from the specimen.

A scanning charged particle microscope, comprising:

• a gas field ionization ion source having a needle-shaped anode emitter, and an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted, wherein a cooling substance for cooling the emitter is a solid-state substance obtained by solidifying a refrigerant gas which is in the gaseous state under room temperature and atmospheric pressure conditions;
• a lens system by which ions from the ion source are accelerated and focused on a specimen;
• a limiting apparatus plate for limiting the ions which are focused on the specimen;
• and
• a charged particle detector to detect charged particles emitted from the specimen.

A method for adjusting the optical axis of a scanning charged particle microscope comprising:

• a gas field ionization ion source having a needle-shaped anode emitter, and an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted;
• a lens system by which ions from the ion source are accelerated and focused on a specimen;
• a limiting apparatus plate for limiting the ions which are focused on the specimen;
• and
• a charged particle detector to detect charged particles emitted from the specimen;
• wherein the angular range of emitted ions allowed to pass through the extraction electrode is set larger for adjusting the optical axis of the gas field ionization ion source but smaller than for adjusting the optical axis for using the scanning charged particle microscope to observe the specimen.

A method for observing a specimen by using a scanning charged particle microscope comprising:

• a gas field ionization ion source having a needle-shaped anode emitter, and an extraction electrode which forms an electric field by which gas molecules at the apex of the emitter are ionized and extracted;
• a lens system by which ions from the ion source are accelerated and focused on a specimen;
• a limiting apparatus plate for limiting the ions which are focused on the specimen;
• and
• a charged particle detector to detect charged particles emitted from the specimen;
• wherein the angular range of emitted ions allowed to pass through the extraction electrode is set larger for adjusting the optical axis of the gas field ionization ion source but smaller than for adjusting the optical axis for using the scanning charged particle microscope to observe the specimen.