Temperature compensation for floating gate circuits

Abstract

A system and method is provided for improving the accuracy of the voltage reference output of a floating gate voltage reference circuit by minimizing the temperature coefficient, Tc. The system and method provides a minimized Tc on output reference voltage, for a wide variety of such output voltages. In a dual floating gate voltage reference circuit wherein a voltage reference output (Vref) is generated as a function of the difference in charge of said floating gates, a method includes causing each of the floating gates to change voltage substantially the same amount as a function of temperature such that, during a read mode of the reference circuit, the temperature coefficient, Tc, of the voltage reference output is substantially reduced. The system and method achieves very low Tc over a wide range of reference or comparator voltages using low cost analog test equipment and methods.

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