Integrated Spectrum Analyzer Circuits and Methods for Providing On-Chip Diagnostics
AssigneeInternational Business Machines Corporation
InventorsKeith Aelwyn Jenkins, Anup Paul Jose, Scott Kevin Reynolds
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Abstract
Spectrum analyzer circuits and methods are provided which implement “zero-IF” (direct conversion) or “near-zero IF” (or very low IF) architectures that enable implementation of integrated (on-chip) spectrum analyzers for measuring the frequency spectrum of internal chip signals. An integrated spectrum analyzer circuit, which comprises a zero IF or near-zero IF framework, enables a low-power compact design with sufficient resolution bandwidth for on-chip implementation and diagnostics of internal chip signals.
Claims21
A semiconductor integrated spectrum analyzer circuit comprising a zero IF (intermediate frequency) or near-zero IF spectrum analyzer circuit architecture to measure a frequency spectrum of an analog on-chip SUT (signal under test) that is generated by an integrated circuit formed on a same chip as the semiconductor integrated spectrum analyzer circuit, wherein frequency components of the SUT are down-converted to a zero or near-zero intermediate frequency which is converted to a DC voltage proportional to a logarithm of the amplitude of the frequency of a swept frequency LO (local oscillator) signal source, wherein the amplitude of the SUT is measured as a function of frequency at an offset from a carrier frequency of said SUT.
A semiconductor IC (integrated circuit) chip, comprising:
- an integrated circuit that generates an analog internal chip signal;
- and
- an integrated spectrum analyzer circuit that measures a frequency spectrum of the internal chip signal, wherein frequency components of the internal chip signal are down-converted to an intermediate frequency which is converted to a DC voltage signal proportional to a logarithm of the amplitude of the frequency of a swept frequency LO (local oscillator) signal source, wherein the amplitude of the internal chip signal is measured as a function of frequency at an offset from a carrier frequency of said internal chip signal.
Dependencies are inferred from the claim text.