Charged particle beam equipments, and charged particle beam microscope
AssigneeHitachi, Ltd.
InventorsOsamu Kamimura, Hiroya Ohta
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AssigneeHitachi, Ltd.
InventorsOsamu Kamimura, Hiroya Ohta
Estimating the term…
In an electron microscope to which a phase retrieval method is applied, an image size determined by a pixel size p of a diffraction pattern, a camera length L, and a wavelength λ of an illumination beam is allowed to have a certain relation with an illumination area on a specimen. Further, a beam illumination area or a scanning area of a deflector when a magnified image is observed is set by an illumination adjustment system, so that an image size when the magnified image is used for the phase retrieval method is allowed to have a certain relation with the image size determined by the pixel size of the diffraction pattern, the camera length, and the wavelength of the illumination beam. Accordingly, the information of the diffraction pattern is substantially equal to an object image to be reconstructed.
Charged particle beam equipment comprising:
A charged particle beam microscope comprising:
A charged particle beam microscope comprising:
Dependencies are inferred from the claim text.