Test apparatus, and device for calibration

A test apparatus that tests a device under test, comprising:

• a first driver and a second driver configured to measure a test signal to be input into the device under test at a given timing;
• a deciding section configured to determine a quality of the device under test on the basis of a measured signal output from the device under test responsive to the test signal;
• a jitter injecting section configured to inject jitter into the test signal output from the first driver and the second driver and provide a first adjustment signal and a second adjustment signal having the same jitter injected into the test signal;
• a first sampling section and a second sampling section that sample the first adjustment signal and the second adjustment signal at a given sampling clock timing;
• a skew computing section configured to compute a skew between the first driver and the second driver on the basis of sampling results of the first sampling section and the second sampling section;
• and
• a phase adjusting section configured to adjust the output timing of at least one of the first driver and the second driver on the basis of a skew computed from the skew computing section.

A device for calibration useful for measuring a skew between drivers in a test apparatus having a plurality of drivers for outputting test signals to a device under test and a plurality of comparators for measuring measured signals from the device under test, the device for calibration comprising:

• a plurality of input pins that are provided one-to-one corresponding to the plurality of drivers and configured to receive the test signal from the corresponding driver;
• a jitter injecting section configured to inject jitter into the respective test signals received by the input pins;
• and
• a plurality of output pins that are provided one-to-one corresponding to the plurality of comparators and are configured to input each of the test signals having the jitter injected by the jitter injecting section into the corresponding comparator.

A device for calibration that is used for measuring a skew between comparators in a test apparatus having a driver for supplying a signal and a plurality of comparators for measuring measured signals from a device under test, the device for calibration comprising:

• an input pin configured to receive the signal from the driver;
• a jitter injecting section configured to inject a jitter into the signal received by the input pin;
• and
• a plurality of output pins that are provided one-to-one corresponding to the plurality of comparators, and are split and configured to receive the signal having the jitter injected by the jitter injecting section and respectively input the received signal into the corresponding comparator.

A device for calibration that is useful for measuring a skew between drivers and a skew between comparators in a test apparatus having a plurality of drivers for outputting test signals to a device under test and a plurality of comparators for measuring measured signals from the device under test, the device for calibration comprising:

• a plurality of input pins that are provided one-to-one corresponding to the plurality of drivers and receive a signal from the corresponding driver, the signal having been injected with jitter by a jitter injecting section located in the device for calibration or in the test apparatus;
• a plurality of output pins that are provided one-to-one corresponding to the plurality of comparators and input the received signal into the corresponding comparator;
• and
• a connection switching section that inputs the signal received by the corresponding input pin into each output pin when measuring the skew between the plurality of drivers and mutually inputs the signal received by any one of the input pins into the plurality of output pins when measuring the skew between the plurality of comparators.