System and method for thermal analysis using variable thermal resistance

A thermal measurement system configured to perform heat flux differential scanning calorimetry, comprising;

• a measurement assembly for receiving a sample, the measurement assembly comprising an elongated cylinder;
• an infrared lamp assembly disposed circumferentially around the elongated circular cylinder, the infrared lamp assembly comprising a plurality of elongated lamps arranged with their longitudinal axes parallel to an axis of the elongated cylinder and an infrared reflector comprising a cavity having a length approximately the same as that of the elongated cylinder, wherein the cavity comprises a plurality of partial quadric cylindrical surfaces that each describe a portion of a cylindrical shape having a first focus coincident with a position of an elongated lamp;
• and
• a thermal resistor coupled to the measurement assembly and having a variable thermal resistance;
• wherein the thermal resistor is operable to vary the thermal resistance between the measurement assembly and a heat sink during sample measurement.

A method for performing thermal analysis, comprising:

• providing a variable thermal resistor between a sample measurement assembly and a heat siik in a thermal analysis tool;
• heating a sample in the sample measurement assembly when the variable resistor has a first thermal resistance;
• altering the variable resistor so that the variable resistor has a second thermal resistance different from the first thermal resistance;
• and
• cooling the measurement sample while the variable resistor has the second thermal resistance.

A thermal measurement system, comprising:

• a measurement assembly for receiving a sample, the measurement assembly comprising an elongated cylinder configured to receive heat from a heat source external to the elongated cylinder;
• a thermal resistor coupled to the measurement assembly and having a variable thermal resistance;
• and
• a heat sink thermally coupled to the thermal resistor, wherein the thermal resistor is operable to vary thermal resistance between the measurement assembly and the heat sink during sample measurement.

A method of thermal analysis during rapid thermal processing, comprising:

• providing a variable thermal resistor between a sample measurement assembly and a heat sink in a thermal analysis tool;
• heating a sample in the sample measurement assembly when the variable resistor has a first thermal resistance;
• and
• cooling the measurement sample while the variable resistor has a second thermal resistance less than the first thermal resistance.