Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device
AssigneeHynix Semiconductor Inc.
InventorChang-Ho Do
Life of this patent
Estimating the term…
Abstract
A semiconductor memory device in accordance with the present invention is able to facilitate detecting whether a word line fails or not by floating the word line. The semiconductor memory device includes a word line driver, and a floating controller. The word line driver is configured to control a word line to be enabled/disabled. The floating controller is configured to control the word line driver to float the word line in response to a word line floating signal.
Claims25
A semiconductor memory device, comprising:
- a word line driver configured to control a word line to be enabled/disabled;
- and
- a floating controller configured to control the word line driver to float the word line in response to a word line floating signal.
A word line driving circuit, comprising:
- a word line driver configured to drive a word line by supplying a high voltage or a low voltage to the word line;
- and
- a floating controller configured to control the word line driver to prevent the high voltage or the low voltage from being supplied to the word line in response to a word line floating signal.
A method for testing a semiconductor memory device, the method comprising:
- floating a word line in response to a word line floating signal;
- writing data to the floated word line;
- and
- reading the data of the word line.
A semiconductor memory device, comprising:
- a word line floating signal generator configured to generate a word line floating signal for floating a word line;
- and
- a word line configured to be floated in response to the word line floating signal.
Dependencies are inferred from the claim text.