Semiconductor memory device with zq calibration
AssigneeHynix Semiconductor Inc.
InventorsKi-Ho KIM, Ji-Eun Jang
Life of this patent
Estimating the term…
Abstract
A semiconductor memory device is capable of outputting calibration codes to an external circuit. The semiconductor memory device includes a data output control unit for controlling an output of data, a calibration code output control unit for transmitting calibration codes to determine a termination resistance value, a test mode signal generating unit for generating a test mode signal which is enabled in the test mode for outputting the calibration codes, and a test mode control unit for selectively outputting the data or the calibration codes in response to the test mode signal.
Claims20
A semiconductor memory device, comprising:
- a data output control unit configured to control an output of data;
- a calibration code output control unit configured to transmit calibration codes to determine a termination resistance value;
- a test mode signal generating unit configured to generate a test mode signal, which is enabled in a test mode for outputting the calibration codes;
- and
- a test mode control unit configured selectively to output the data or the calibration codes in response to the test mode signal.
A semiconductor memory device, comprising:
- a register for storing calibration codes to determine a termination resistance value;
- and
- a multiplexer for selectively outputting the calibration codes stored in the register or stored data to an outside of the semiconductor memory device.
A semiconductor memory device, comprising:
- a multiplexer for selectively outputting calibration codes to determine a termination resistance value or outputting stored data;
- a pipe latch unit for converting outputs of the multiplexer into serial data;
- and
- an output unit for outputting outputs from the pipe latch unit to an outside of the semiconductor memory device.
Dependencies are inferred from the claim text.