Method of Bonding Probes and Method of Manufacturing a Probe Card Using the Same
AssigneePhicom Corporation
InventorsKi-Joon Kim, Yong-Hwi Jo
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AssigneePhicom Corporation
InventorsKi-Joon Kim, Yong-Hwi Jo
Estimating the term…
In a method of manufacturing bonding probes, bump layer patterns are formed on terminals of a multi-layered substrate. A first wetting layer pattern having a wettability with respect to a solder paste, and a non-wetting layer pattern having a non-wettability with respect to the solder paste are formed on the bump layer patterns. The solder paste is formed on the first wetting layer and the non-wetting layer pattern. The probes, which make contact with an object, are bonded to the solder paste. The solder paste on the non-wetting layer pattern reflows along a surface of the first wetting layer pattern to form an adhesive layer on the first wetting layer pattern. Thus, a sufficient amount of the solder paste, which is required for bonding the probes, may be provided to firmly bond the probes.
A method of bonding probes, comprising:
A method of manufacturing a probe card, comprising:
Dependencies are inferred from the claim text.