Parallel AC measurement method
AssigneeKeithley Instruments, LLC
InventorWayne C. Goeke
Life of this patent
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Abstract
A method for making electrical measurements of a first and a second DUT, the DUTs being in sufficient proximity to exhibit crosstalk therebetween, the method comprising: applying a first signal to the first DUT; applying a second signal to the second DUT, the first signal and the second signal being contemporaneous and orthogonal to each other; measuring a first DUT response; and measuring a second DUT response. The first and second DUT responses exhibit independence from the second and first signals, respectively.
Claims6
A method for making electrical measurements of a first and a second DUT, said DUTs being in sufficient proximity to exhibit crosstalk therebetween, said method comprising:
- applying a first signal to said first DUT;
- applying a second signal to said second DUT, said first signal and said second signal being contemporaneous and orthogonal to each other;
- measuring a first DUT response;
- and
- measuring a second DUT response, wherein said first and second DUT responses exhibit independence from said second and first signals, respectively.
Dependencies are inferred from the claim text.