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US 2008/0258707 A1Published application
Test Method for Frequency Converters with Embedded Local Oscillators
AssigneeAgilent Technologies, Inc.
InventorsJoel P. Dunsmore, Sean Hubert, Loren C. Betts, Johan Ericsson
Life of this patent
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Abstract
A method is presented where the phase trace is offset for each sweep such that the first point is always at zero degrees. The resulting traces are then averaged. The average reduces the noise in the phase trace and results in a less noisy group delay trace.
Claims15
A method of measuring the response of a frequency converter comprising:
- for a vector network analyzer with a reference mixer of a receiver in one channel and a mixer of a device under test (DUT) in another channel, each mixer having a local oscillator;
- measuring the response of the ratio of the DUT mixer to the reference mixer;
- computing the phase response from the ratio of the DUT mixer data and reference mixer data;
- normalizing the phase response by the phase of a predetermined point in the phase sweep;
- and
- averaging the result of several traces.
3 more elements
A method of measuring the response of a frequency converter comprising:
- for a network analyzer;
- determining the frequency of a local oscillator within a device under test (DUT) mixer by measuring the IF frequency;
- offsetting one of the source and the receiver frequency to accommodate offsets in the local oscillator within the DUT mixer;
- and
- measuring the response of the DUT mixer.
2 more elements
A method for determining the frequency of an unknown signal comprising:
- applying the unknown signal to one channel of a vector network analyzer;
- applying a signal of known frequency to another channel of a vector network analyzer;
- measuring the phase vs. time response of the ratio of the signals;
- and
- determining the frequency offset between the two signals based on the change of phase vs. change in time.
2 more elements
Dependencies are inferred from the claim text.