Method and System For a Pattern Layout Split
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsJaw-Jung Shin, King-Chang Shu, Tsai-Sheng Gau, Burn Jeng Lin
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Abstract
A method for splitting a pattern layout including providing the pattern layout having features, checking the pattern layout to determine the features that require splitting, coloring the features that require splitting with a first and second color, resolving coloring conflicts by decomposing the feature with the coloring conflict and coloring the decomposed feature with the first and second color, and generating a first mask with features of the first color and a second mask with features of the second color.
Claims23
A method for splitting a pattern layout, the method comprising:
- providing the pattern layout having a plurality of features;
- checking the pattern layout with a design rule check (DRC) to determine the features that require splitting;
- coloring the features that require splitting with a first color and a second color;
- resolving coloring conflicts by decomposing the feature with the coloring conflict and coloring the decomposed feature with the first color and the second color;
- and
- generating a first mask with features of the first color and a second mask with features of the second color.
A computer-readable medium having a plurality of instructions stored thereon for splitting a pattern layout into separate masks, the instructions comprising:
- providing a pattern layout having a plurality of features;
- checking the pattern layout with a design rule check (DRC) to determine the features that require splitting;
- coloring the features that require splitting with a first color and a second color;
- resolving coloring conflicts by decomposing the feature with the coloring conflict and coloring the decomposed feature with the first color and the second color;
- and
- forming a first mask with features of the first color and a second mask with features of the second color.
A system for generating multiple masks, the system comprising:
- a pattern layout having a plurality of features;
- and
- a mask writer configured and operable for:
- checking the pattern layout to select the features that require splitting into separate layouts;
- coloring the features that require splitting with a first color and a second color, wherein the first color defines a first layout and the second color defines a second layout;
- resolving coloring conflicts with decomposition, wherein the coloring conflicts occur when adjacent features that require splitting are of the same color;
- equalizing and assigning the features that do not require splitting into the first and second layouts;
- and
- forming a first mask representing the first layout and a second mask representing the second layout.
Dependencies are inferred from the claim text.