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US 2008/0189575 A1Published application
Methods and apparatus for data analysis
OwnerEmilio Miguelanez, Michael J. Scotl +3inventors
InventorsEMILIO MIGUELANEZ, Michael J. Scotl, Jacky Gorin, Paul Buxton, Paul Tabor
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
Claims3
A test system, comprising:
- a tester configured to test a set of components and generate test data for the set of components;
- and
- a diagnostic system configured to receive the test data from the tester and automatically analyze the test data to identify a problem in a process for fabricating the components, wherein the diagnostic system is configured to recognize a pattern in the test data and match the recognized pattern with the problem.
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Dependencies are inferred from the claim text.