Semiconductor device and production method therefor
AssigneeRohm Co., Ltd.
InventorGoro Nakatani
Life of this patent
Estimating the term…
Loading patent…
AssigneeRohm Co., Ltd.
InventorGoro Nakatani
Estimating the term…
A semiconductor device provided with: a first interconnection layer provided on a semiconductor substrate; an interlevel insulation film provided over the first interconnection layer; a second interconnection layer of gold provided as an uppermost interconnection layer on the interlevel insulation film; and a barrier layer provided between the first interconnection layer and the second interconnection layer in an interlevel connection opening formed in the interlevel insulation film. The barrier layer includes a first sublayer provided in contact with the first interconnection layer to reduce a contact resistance, a second sublayer provided in contact with the second interconnection layer to improve a bonding strength, and a third sublayer provided between the first sublayer and the second sublayer. The first sublayer, the second sublayer and the third sublayer are, for example, a first tantalum sublayer, a second tantalum sublayer and a tantalum nitride sublayer, respectively.
1-6. (canceled)
A semiconductor device production method for producing a semiconductor device in which a first interconnection layer and a second interconnection layer stacked with an intervention of an interlevel insulation film are electrically connected to each other through an interlevel connection opening formed in the interlevel insulation film, the method comprising the steps of:
Dependencies are inferred from the claim text.