Methods of Manufacturing Non-Volatile Memory Devices Including Charge-Trapping Layers
AssigneeSamsung Electronics Co., Ltd.
InventorsWoo Gwan Shim, Mong-Sup Lee, Ji-Hoon Cha, Chang-Ki Hong, Kun-Tack Lee
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AssigneeSamsung Electronics Co., Ltd.
InventorsWoo Gwan Shim, Mong-Sup Lee, Ji-Hoon Cha, Chang-Ki Hong, Kun-Tack Lee
Estimating the term…
Methods of manufacturing non-volatile memory devices are provided including sequentially forming a tunnel insulating layer, a charge-trapping layer, a blocking layer and a conductive layer on a substrate having a channel region. The conductive layer is patterned to form a word line structure, and the blocking layer and the charge-trapping layer are etched using an aqueous acid solution as an etching solution to form a blocking layer pattern and a charge-trapping layer pattern.
A method of manufacturing a non-volatile memory device, the method comprising:
Dependencies are inferred from the claim text.