Testing and burn-in using a strip socket
AssigneeNS Electronics Bangkok Ltd
InventorsSaruch Sangaunwong, Prayoch Tayaphat, Pinut Boonareeroj
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Abstract
A method and apparatus are provided for using a strip socket in testing or burn-in of semiconductor devices in a strip. In one example of the method, processing of semiconductor devices involves assembling the semiconductor devices into a strip, isolating a portion of each of the semiconductor devices of the strip, and performing operations on the strip using a strip socket, wherein the strip socket is designed to make electrical contact substantially simultaneously with each semiconductor device in the strip.
Claims13
A method of processing semiconductor devices, the method comprising:
- assembling the semiconductor devices into a leadframe strip;
- electrically isolating a portion of each of the semiconductor devices of the strip;
- and
- performing operations on the semiconductor devices in the strip using a strip socket, wherein the strip socket to make electrical contact substantially simultaneously with each semiconductor device in the strip.
13-22. (canceled)
Dependencies are inferred from the claim text.